A Structural Causal Model for Electronic Device Reliability: From Effects to Counterfactuals

Fuente: arXiv

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Bibliographic Details
Main Authors:	Stefanini, Federico Mattia, Nikiforova, Nedka Dechkova, Berni, Rossella
Format:	Preprint
Published:	2025
Subjects:	Applications 62D20
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2506.18663