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| Auteurs principaux: | , |
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| Format: | Preprint |
| Publié: |
2025
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| Sujets: | |
| Accès en ligne: | https://arxiv.org/abs/2506.19239 |
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Table des matières:
- We show that a random light field can be harnessed for high-precision metrology by introducing specific boundary conditions in the form of Lambertian reflections inside a cavity. We demonstrate a quantifiable and reproducible interferometric response to minute perturbations in wavelength, refractive index, and geometry, predicting high sensitivities consistent with experimental measurements of geometrical deformations down to the picometer scale.