High-throughput spin-bath characterization of spin-defects in semiconductors

Fuente: arXiv
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Bibliographic Details
Main Authors: Poteshman, Abigail N., Onizhuk, Mykyta, Egerstrom, Christopher, Mark, Daniel P., Awschalom, David D., Heremans, F. Joseph, Galli, Giulia
Format: Preprint
Published: 2025
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