Tian, L., Li, Y., Dai, Y., Chen, W., Liu, X., & Chen, B. (2025). FastRef: Fast Prototype Refinement for Few-Shot Industrial Anomaly Detection.
Citazione stile Chigago Style (17a edizione)Tian, Long, Yufei Li, Yuyang Dai, Wenchao Chen, Xiyang Liu, e Bo Chen. FastRef: Fast Prototype Refinement for Few-Shot Industrial Anomaly Detection. 2025.
Citatione MLA (9a ed.)Tian, Long, et al. FastRef: Fast Prototype Refinement for Few-Shot Industrial Anomaly Detection. 2025.
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