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FastRef:Fast Prototype Refinement for Few-Shot Industrial Anomaly Detection

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Tian, Long, Li, Yufei, Dai, Yuyang, Chen, Wenchao, Liu, Xiyang, Chen, Bo
Formato:	Preprint
Publicado:	2025
Materias:	Computer Vision and Pattern Recognition
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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