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FastRef:Fast Prototype Refinement for Few-Shot Industrial Anomaly Detection

Fuente: arXiv

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Bibliographic Details
Main Authors:	Tian, Long, Li, Yufei, Dai, Yuyang, Chen, Wenchao, Liu, Xiyang, Chen, Bo
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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