Fast Simulation of Damage Diffusion Distribution in Scanning Transmission Electron Microscopy
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arXiv
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| Autores principales: | , , , |
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| Formato: | Preprint |
| Publicado: |
2025
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| Materias: | |
| Acceso en línea: | |
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| _version_ | 1866911030316105728 |
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| author | Rad, Amir Javadi Moshtaghpour, Amirafshar Chen, Dongdong Kirkland, Angus I. |
| author_facet | Rad, Amir Javadi Moshtaghpour, Amirafshar Chen, Dongdong Kirkland, Angus I. |
| contents | Scanning Transmission Electron Microscopy (STEM) is a critical tool for imaging the properties of materials and biological specimens at atomic scale, yet our understanding of relevant electron beam damage mechanisms is incomplete. Recent studies suggest that certain types of damage can be modelled as a diffusion process. However, numerical simulation of such diffusion processes has remained computationally intensive. This work introduces a high-performance C++ framework for simulating damage diffusion process in STEM that combines efficient numerical computation, advanced visualisations, and multithreading to achieve efficient runtime while maintaining accuracy. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2507_00294 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Fast Simulation of Damage Diffusion Distribution in Scanning Transmission Electron Microscopy Rad, Amir Javadi Moshtaghpour, Amirafshar Chen, Dongdong Kirkland, Angus I. Signal Processing Materials Science Scanning Transmission Electron Microscopy (STEM) is a critical tool for imaging the properties of materials and biological specimens at atomic scale, yet our understanding of relevant electron beam damage mechanisms is incomplete. Recent studies suggest that certain types of damage can be modelled as a diffusion process. However, numerical simulation of such diffusion processes has remained computationally intensive. This work introduces a high-performance C++ framework for simulating damage diffusion process in STEM that combines efficient numerical computation, advanced visualisations, and multithreading to achieve efficient runtime while maintaining accuracy. |
| title | Fast Simulation of Damage Diffusion Distribution in Scanning Transmission Electron Microscopy |
| topic | Signal Processing Materials Science |
| url | https://arxiv.org/abs/2507.00294 |