Temperature and Magnetic-Field Dependence of Energy Relaxation in a Fluxonium Qubit

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Ateshian, Lamia, Hays, Max, Rower, David A., Zhang, Helin, Azar, Kate, Assouly, Réouven, Ding, Leon, Gingras, Michael, Stickler, Hannah, Niedzielski, Bethany M., Schwartz, Mollie E., Orlando, Terry P., Wang, Joel Î-j., Gustavsson, Simon, Grover, Jeffrey A., Serniak, Kyle, Oliver, William D.
Format: Preprint
Published: 2025
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866912460019073024
author Ateshian, Lamia
Hays, Max
Rower, David A.
Zhang, Helin
Azar, Kate
Assouly, Réouven
Ding, Leon
Gingras, Michael
Stickler, Hannah
Niedzielski, Bethany M.
Schwartz, Mollie E.
Orlando, Terry P.
Wang, Joel Î-j.
Gustavsson, Simon
Grover, Jeffrey A.
Serniak, Kyle
Oliver, William D.
author_facet Ateshian, Lamia
Hays, Max
Rower, David A.
Zhang, Helin
Azar, Kate
Assouly, Réouven
Ding, Leon
Gingras, Michael
Stickler, Hannah
Niedzielski, Bethany M.
Schwartz, Mollie E.
Orlando, Terry P.
Wang, Joel Î-j.
Gustavsson, Simon
Grover, Jeffrey A.
Serniak, Kyle
Oliver, William D.
contents Noise from material defects at device interfaces is known to limit the coherence of superconducting circuits, yet our understanding of the defect origins and noise mechanisms remains incomplete. Here we investigate the temperature and in-plane magnetic-field dependence of energy relaxation in a low-frequency fluxonium qubit, where the sensitivity to flux noise and charge noise arising from dielectric loss can be tuned by applied flux. We observe an approximately linear scaling of flux noise with temperature $T$ and a power-law dependence of dielectric loss $T^3$ up to 100 mK. Additionally, we find that the dielectric-loss-limited $T_1$ decreases with weak in-plane magnetic fields, suggesting a potential magnetic-field response of the underlying charge-coupled defects. We implement a multi-level decoherence model in our analysis, motivated by the widely tunable matrix elements and transition energies approaching the thermal energy scale in our system. These findings offer insight for fluxonium coherence modeling and should inform microscopic theories of intrinsic noise in superconducting circuits.
format Preprint
id arxiv_https___arxiv_org_abs_2507_01175
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Temperature and Magnetic-Field Dependence of Energy Relaxation in a Fluxonium Qubit
Ateshian, Lamia
Hays, Max
Rower, David A.
Zhang, Helin
Azar, Kate
Assouly, Réouven
Ding, Leon
Gingras, Michael
Stickler, Hannah
Niedzielski, Bethany M.
Schwartz, Mollie E.
Orlando, Terry P.
Wang, Joel Î-j.
Gustavsson, Simon
Grover, Jeffrey A.
Serniak, Kyle
Oliver, William D.
Quantum Physics
Mesoscale and Nanoscale Physics
Noise from material defects at device interfaces is known to limit the coherence of superconducting circuits, yet our understanding of the defect origins and noise mechanisms remains incomplete. Here we investigate the temperature and in-plane magnetic-field dependence of energy relaxation in a low-frequency fluxonium qubit, where the sensitivity to flux noise and charge noise arising from dielectric loss can be tuned by applied flux. We observe an approximately linear scaling of flux noise with temperature $T$ and a power-law dependence of dielectric loss $T^3$ up to 100 mK. Additionally, we find that the dielectric-loss-limited $T_1$ decreases with weak in-plane magnetic fields, suggesting a potential magnetic-field response of the underlying charge-coupled defects. We implement a multi-level decoherence model in our analysis, motivated by the widely tunable matrix elements and transition energies approaching the thermal energy scale in our system. These findings offer insight for fluxonium coherence modeling and should inform microscopic theories of intrinsic noise in superconducting circuits.
title Temperature and Magnetic-Field Dependence of Energy Relaxation in a Fluxonium Qubit
topic Quantum Physics
Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2507.01175