Gas, K., & Sawicki, M. (2025). Reliable Magnetometry for Antiferromagnets and Thin Films: Correcting Substrate Artifacts in Mn3Sn/MgO Systems.
Chicago Style (17th ed.) CitationGas, Katarzyna, and Maciej Sawicki. Reliable Magnetometry for Antiferromagnets and Thin Films: Correcting Substrate Artifacts in Mn3Sn/MgO Systems. 2025.
MLA (9th ed.) CitationGas, Katarzyna, and Maciej Sawicki. Reliable Magnetometry for Antiferromagnets and Thin Films: Correcting Substrate Artifacts in Mn3Sn/MgO Systems. 2025.
Warning: These citations may not always be 100% accurate.