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Reliable Magnetometry for Antiferromagnets and Thin Films: Correcting Substrate Artifacts in Mn3Sn/MgO Systems

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Gas, Katarzyna, Sawicki, Maciej
Natura:	Preprint
Pubblicazione:	2025
Soggetti:	Materials Science
Accesso online:	Acceder al recurso
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