APA (7th ed.) Citation

Wissel, S., Scheunert, J., Dextre, A., Ahmed, S., Bayer, A., Volz, K., & Xu, B. (2025). STEM Diffraction Pattern Analysis with Deep Learning Networks.

Chicago Style (17th ed.) Citation

Wissel, Sebastian, Jonas Scheunert, Aaron Dextre, Shamail Ahmed, Andreas Bayer, Kerstin Volz, and Bai-Xiang Xu. STEM Diffraction Pattern Analysis with Deep Learning Networks. 2025.

MLA (9th ed.) Citation

Wissel, Sebastian, et al. STEM Diffraction Pattern Analysis with Deep Learning Networks. 2025.