Semi-Supervised Defect Detection via Conditional Diffusion and CLIP-Guided Noise Filtering

Fuente: arXiv

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Bibliographic Details
Main Authors:	Li, Shuai, Chen, Shihan, Geng, Wanru, Xu, Zhaohua, Liu, Xiaolu, Dong, Can, Tian, Zhen, Chen, Changlin
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2507.05588