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| Main Authors: | , , |
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| Format: | Preprint |
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2025
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| Online Access: | https://arxiv.org/abs/2507.07268 |
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| _version_ | 1866918087861731328 |
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| author | Saucedo, Joel Lamba, Uday Mahabaduge, Hasitha |
| author_facet | Saucedo, Joel Lamba, Uday Mahabaduge, Hasitha |
| contents | A persistent paradox complicates the study of plasma-irradiated thin films, where bimodal grain distributions and ambiguous scaling laws, roughly shifting between $Φ^{-1/2}$ and $Φ^{-1}$, or a general inverse dependence on plasma flux, are empirical yet remain theoretically unreconciled. Existing models fail to unify noise-driven evolution, defect saturation kinetics, and nucleation-loss balance within a single, self-consistent formalism. This work resolves these discrepancies by developing the first exact analytical theory for this system. We derive the closed-form steady-state grain area distribution, $P_{ss}(A)$, establish the precise dimensionless threshold for bimodality onset at $Π_c = 4/(3\sqrt{3})$, and demonstrate that defect saturation physics mandate a universal $\langle A \rangle \propto κ^2 Φ^{-1} e^{+2E_b/k_B T_s}$ scaling law. The framework reveals how competition between stochastic impingement and deterministic growth triggers microstructure fragmentation, resolving long-standing ambiguities in irradiation-induced surface evolution and providing a predictive foundation for materials processing. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2507_07268 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Exact Solutions for Bimodal Distributions under Stochastic Plasma Irradiation in Thin Films Saucedo, Joel Lamba, Uday Mahabaduge, Hasitha Materials Science Plasma Physics A persistent paradox complicates the study of plasma-irradiated thin films, where bimodal grain distributions and ambiguous scaling laws, roughly shifting between $Φ^{-1/2}$ and $Φ^{-1}$, or a general inverse dependence on plasma flux, are empirical yet remain theoretically unreconciled. Existing models fail to unify noise-driven evolution, defect saturation kinetics, and nucleation-loss balance within a single, self-consistent formalism. This work resolves these discrepancies by developing the first exact analytical theory for this system. We derive the closed-form steady-state grain area distribution, $P_{ss}(A)$, establish the precise dimensionless threshold for bimodality onset at $Π_c = 4/(3\sqrt{3})$, and demonstrate that defect saturation physics mandate a universal $\langle A \rangle \propto κ^2 Φ^{-1} e^{+2E_b/k_B T_s}$ scaling law. The framework reveals how competition between stochastic impingement and deterministic growth triggers microstructure fragmentation, resolving long-standing ambiguities in irradiation-induced surface evolution and providing a predictive foundation for materials processing. |
| title | Exact Solutions for Bimodal Distributions under Stochastic Plasma Irradiation in Thin Films |
| topic | Materials Science Plasma Physics |
| url | https://arxiv.org/abs/2507.07268 |