Towards High-Resolution 3D Anomaly Detection: A Scalable Dataset and Real-Time Framework for Subtle Industrial Defects

Fuente: arXiv

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Bibliographic Details
Main Authors:	Cheng, Yuqi, Sun, Yihan, Zhang, Hui, Shen, Weiming, Cao, Yunkang
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2507.07435