Qualcomm Trusted Application Emulation for Fuzzing Testing

Fuente: arXiv

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Bibliographic Details
Main Authors:	Fan, Chun-I, Chang, Li-En, Shie, Cheng-Han
Format:	Preprint
Published:	2025
Subjects:	Cryptography and Security
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2507.08331