Spin Squeezing in Electron Microscopy
Fuente:
arXiv
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| Autori principali: | , , , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2025
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| Soggetti: | |
| Accesso online: | |
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| _version_ | 1866915385797771264 |
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| author | Even-Haim, Shiran Nussinson, Ethan Ben-Maimon, Roni Gorlach, Alexey Ruimy, Ron Shahmoon, Ephraim Schwartz, Osip Kaminer, Ido |
| author_facet | Even-Haim, Shiran Nussinson, Ethan Ben-Maimon, Roni Gorlach, Alexey Ruimy, Ron Shahmoon, Ephraim Schwartz, Osip Kaminer, Ido |
| contents | Quantum metrology experiments in atomic physics and quantum optics have demonstrated measurement accuracy beyond the shot-noise limit via multi-particle entanglement. At the same time, electron microscopy, an essential tool for high-resolution imaging of biological systems, is severely constrained in its signal-to-noise ratio (SNR) by shot noise, due to the dose limit imposed by electron beam-induced damage. Here, we show theoretically that spin squeezing, a form of quantum metrology based on entanglement, is a natural fit for improving the SNR in electron microscopy. We investigate the generation of the necessary entangled states through electron-electron Coulomb interactions and quantum non-demolition measurements. Our results connect the fields of quantum metrology and electron interferometry, paving the way toward electron microscopy with SNR beyond the shot-noise limit. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2507_09243 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Spin Squeezing in Electron Microscopy Even-Haim, Shiran Nussinson, Ethan Ben-Maimon, Roni Gorlach, Alexey Ruimy, Ron Shahmoon, Ephraim Schwartz, Osip Kaminer, Ido Quantum Physics Quantum metrology experiments in atomic physics and quantum optics have demonstrated measurement accuracy beyond the shot-noise limit via multi-particle entanglement. At the same time, electron microscopy, an essential tool for high-resolution imaging of biological systems, is severely constrained in its signal-to-noise ratio (SNR) by shot noise, due to the dose limit imposed by electron beam-induced damage. Here, we show theoretically that spin squeezing, a form of quantum metrology based on entanglement, is a natural fit for improving the SNR in electron microscopy. We investigate the generation of the necessary entangled states through electron-electron Coulomb interactions and quantum non-demolition measurements. Our results connect the fields of quantum metrology and electron interferometry, paving the way toward electron microscopy with SNR beyond the shot-noise limit. |
| title | Spin Squeezing in Electron Microscopy |
| topic | Quantum Physics |
| url | https://arxiv.org/abs/2507.09243 |