It Only Gets Worse: Revisiting DL-Based Vulnerability Detectors from a Practical Perspective

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Wang, Yunqian, Li, Xiaohong, Zhang, Yao, Li, Yuekang, Zhou, Zhiping, Feng, Ruitao
Format:	Preprint
Published:	2025
Subjects:	Software Engineering
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2507.09529