Regret Analysis of Posterior Sampling-Based Expected Improvement for Bayesian Optimization

Fuente: arXiv
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Autori principali: Takeno, Shion, Inatsu, Yu, Karasuyama, Masayuki, Takeuchi, Ichiro
Natura: Preprint
Pubblicazione: 2025
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author Takeno, Shion
Inatsu, Yu
Karasuyama, Masayuki
Takeuchi, Ichiro
author_facet Takeno, Shion
Inatsu, Yu
Karasuyama, Masayuki
Takeuchi, Ichiro
contents Bayesian optimization is a powerful tool for optimizing an expensive-to-evaluate black-box function. In particular, the effectiveness of expected improvement (EI) has been demonstrated in a wide range of applications. However, theoretical analyses of EI are limited compared with other theoretically established algorithms. This paper analyzes a randomized variant of EI, which evaluates the EI from the maximum of the posterior sample path. We show that this posterior sampling-based random EI achieves the sublinear Bayesian cumulative regret bounds under the assumption that the black-box function follows a Gaussian process. Finally, we demonstrate the effectiveness of the proposed method through numerical experiments.
format Preprint
id arxiv_https___arxiv_org_abs_2507_09828
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Regret Analysis of Posterior Sampling-Based Expected Improvement for Bayesian Optimization
Takeno, Shion
Inatsu, Yu
Karasuyama, Masayuki
Takeuchi, Ichiro
Machine Learning
Bayesian optimization is a powerful tool for optimizing an expensive-to-evaluate black-box function. In particular, the effectiveness of expected improvement (EI) has been demonstrated in a wide range of applications. However, theoretical analyses of EI are limited compared with other theoretically established algorithms. This paper analyzes a randomized variant of EI, which evaluates the EI from the maximum of the posterior sample path. We show that this posterior sampling-based random EI achieves the sublinear Bayesian cumulative regret bounds under the assumption that the black-box function follows a Gaussian process. Finally, we demonstrate the effectiveness of the proposed method through numerical experiments.
title Regret Analysis of Posterior Sampling-Based Expected Improvement for Bayesian Optimization
topic Machine Learning
url https://arxiv.org/abs/2507.09828