A Spatial-Physics Informed Model for 3D Spiral Sample Scanned by SQUID Microscopy
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arXiv
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| Autori principali: | , , , , , , , |
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| Natura: | Preprint |
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2025
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| author | Senthilnath, J. Jayabalan, Jayasanker Lin, Zhuoyi Aung, Aye Phyu Phyu Hao, Chen Xu, Kaixin Lim, Yeow Kheng Wellstood, F. C. |
| author_facet | Senthilnath, J. Jayabalan, Jayasanker Lin, Zhuoyi Aung, Aye Phyu Phyu Hao, Chen Xu, Kaixin Lim, Yeow Kheng Wellstood, F. C. |
| contents | The development of advanced packaging is essential in the semiconductor manufacturing industry. However, non-destructive testing (NDT) of advanced packaging becomes increasingly challenging due to the depth and complexity of the layers involved. In such a scenario, Magnetic field imaging (MFI) enables the imaging of magnetic fields generated by currents. For MFI to be effective in NDT, the magnetic fields must be converted into current density. This conversion has typically relied solely on a Fast Fourier Transform (FFT) for magnetic field inversion; however, the existing approach does not consider eddy current effects or image misalignment in the test setup. In this paper, we present a spatial-physics informed model (SPIM) designed for a 3D spiral sample scanned using Superconducting QUantum Interference Device (SQUID) microscopy. The SPIM encompasses three key components: i) magnetic image enhancement by aligning all the "sharp" wire field signals to mitigate the eddy current effect using both in-phase (I-channel) and quadrature-phase (Q-channel) images; (ii) magnetic image alignment that addresses skew effects caused by any misalignment of the scanning SQUID microscope relative to the wire segments; and (iii) an inversion method for converting magnetic fields to magnetic currents by integrating the Biot-Savart Law with FFT. The results show that the SPIM improves I-channel sharpness by 0.3% and reduces Q-channel sharpness by 25%. Also, we were able to remove rotational and skew misalignments of 0.30 in a real image. Overall, SPIM highlights the potential of combining spatial analysis with physics-driven models in practical applications. |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2507_11853 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | A Spatial-Physics Informed Model for 3D Spiral Sample Scanned by SQUID Microscopy Senthilnath, J. Jayabalan, Jayasanker Lin, Zhuoyi Aung, Aye Phyu Phyu Hao, Chen Xu, Kaixin Lim, Yeow Kheng Wellstood, F. C. Instrumentation and Detectors Computer Vision and Pattern Recognition The development of advanced packaging is essential in the semiconductor manufacturing industry. However, non-destructive testing (NDT) of advanced packaging becomes increasingly challenging due to the depth and complexity of the layers involved. In such a scenario, Magnetic field imaging (MFI) enables the imaging of magnetic fields generated by currents. For MFI to be effective in NDT, the magnetic fields must be converted into current density. This conversion has typically relied solely on a Fast Fourier Transform (FFT) for magnetic field inversion; however, the existing approach does not consider eddy current effects or image misalignment in the test setup. In this paper, we present a spatial-physics informed model (SPIM) designed for a 3D spiral sample scanned using Superconducting QUantum Interference Device (SQUID) microscopy. The SPIM encompasses three key components: i) magnetic image enhancement by aligning all the "sharp" wire field signals to mitigate the eddy current effect using both in-phase (I-channel) and quadrature-phase (Q-channel) images; (ii) magnetic image alignment that addresses skew effects caused by any misalignment of the scanning SQUID microscope relative to the wire segments; and (iii) an inversion method for converting magnetic fields to magnetic currents by integrating the Biot-Savart Law with FFT. The results show that the SPIM improves I-channel sharpness by 0.3% and reduces Q-channel sharpness by 25%. Also, we were able to remove rotational and skew misalignments of 0.30 in a real image. Overall, SPIM highlights the potential of combining spatial analysis with physics-driven models in practical applications. |
| title | A Spatial-Physics Informed Model for 3D Spiral Sample Scanned by SQUID Microscopy |
| topic | Instrumentation and Detectors Computer Vision and Pattern Recognition |
| url | https://arxiv.org/abs/2507.11853 |