A Semi-Supervised Learning Method for the Identification of Bad Exposures in Large Imaging Surveys

Fuente: arXiv
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Bibliographic Details
Main Authors: Luo, Yufeng, Myers, Adam D., Drlica-Wagner, Alex, Dematties, Dario, Borchani, Salma, Valdes, Francisco, Dey, Arjun, Schlegel, David, Zhou, Rongpu, Team, DESI Legacy Imaging Surveys
Format: Preprint
Published: 2025
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