A Comprehensive Survey for Real-World Industrial Defect Detection: Challenges, Approaches, and Prospects

Fuente: arXiv

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Bibliographic Details
Main Authors:	Cheng, Yuqi, Cao, Yunkang, Yao, Haiming, Luo, Wei, Jiang, Cheng, Zhang, Hui, Shen, Weiming
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2507.13378