Sub-kelvin measurement of silicon thermal expansion with a Fabry-Pérot cavity stabilized laser

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Roset, Pierre, Hariri, Yara, Meyer, Rémi, Millo, Jacques, Lacroûte, Clément, Margueron, Samuel, Kersalé, Yann, Gillot, Jonathan
Format: Preprint
Published: 2025
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866918097304158208
author Roset, Pierre
Hariri, Yara
Meyer, Rémi
Millo, Jacques
Lacroûte, Clément
Margueron, Samuel
Kersalé, Yann
Gillot, Jonathan
author_facet Roset, Pierre
Hariri, Yara
Meyer, Rémi
Millo, Jacques
Lacroûte, Clément
Margueron, Samuel
Kersalé, Yann
Gillot, Jonathan
contents In this letter, we report the measurement of the coefficient of thermal expansion (CTE) of single-crystal silicon from 655 mK to 16 K using an ultra-stable laser based on a single-crystal silicon Fabry-Perot cavity. Below 1 K temperatures, the CTE is in the $10^{-13}$ K$^{-1}$ range with a lowest point at $\boldsymbol{α(}655$ mK$ \boldsymbol{)=} 3.5 \pm 0.4 \times 10^{-13}$ K$^{-1}$. We produce a theoretical model based on Debye and Einstein models to effectively approximate the CTE measured in this temperature range. This is the lowest-temperature CTE measurement of silicon to date, as well as the lowest operating temperature for an ultra-stable Fabry-Perot cavity for laser frequency stabilization.
format Preprint
id arxiv_https___arxiv_org_abs_2507_13976
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Sub-kelvin measurement of silicon thermal expansion with a Fabry-Pérot cavity stabilized laser
Roset, Pierre
Hariri, Yara
Meyer, Rémi
Millo, Jacques
Lacroûte, Clément
Margueron, Samuel
Kersalé, Yann
Gillot, Jonathan
Optics
In this letter, we report the measurement of the coefficient of thermal expansion (CTE) of single-crystal silicon from 655 mK to 16 K using an ultra-stable laser based on a single-crystal silicon Fabry-Perot cavity. Below 1 K temperatures, the CTE is in the $10^{-13}$ K$^{-1}$ range with a lowest point at $\boldsymbol{α(}655$ mK$ \boldsymbol{)=} 3.5 \pm 0.4 \times 10^{-13}$ K$^{-1}$. We produce a theoretical model based on Debye and Einstein models to effectively approximate the CTE measured in this temperature range. This is the lowest-temperature CTE measurement of silicon to date, as well as the lowest operating temperature for an ultra-stable Fabry-Perot cavity for laser frequency stabilization.
title Sub-kelvin measurement of silicon thermal expansion with a Fabry-Pérot cavity stabilized laser
topic Optics
url https://arxiv.org/abs/2507.13976