Multi-Sampling-Frequency Naturalness MOS Prediction Using Self-Supervised Learning Model with Sampling-Frequency-Independent Layer

Fuente: arXiv
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Bibliographic Details
Main Authors: Nishikawa, Go, Nakata, Wataru, Saito, Yuki, Imamura, Kanami, Saruwatari, Hiroshi, Nakamura, Tomohiko
Format: Preprint
Published: 2025
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