Label free sub-diffraction imaging using non-linear photon avalanche backlight
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| Format: | Preprint |
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2025
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| _version_ | 1866911066598932480 |
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| author | Karmegam, Suresh Szalkowski, Marcin Misiak, Malgorzata Prorok, Katarzyna Szymański, Damian Bednarkiewicz, Artur |
| author_facet | Karmegam, Suresh Szalkowski, Marcin Misiak, Malgorzata Prorok, Katarzyna Szymański, Damian Bednarkiewicz, Artur |
| contents | Optical imaging below the limit of light diffraction offers an unprecedented opportunity to study outlook, organization, interactions or in-situ functioning of sub-micrometer, highly transparent objects such as subcellular structures in vitro, thin layers or nano-engineered devices. However, most of current methodologies require to use specially designed luminescent labels, which not only may affect the properties of the sample itself, but often are (photo)toxic, susceptible to photobleaching, offer limited color combinations or specificity of labeling. Moreover, the dedicated fluorescence based super-resolution optical techniques are often technically complex and cumbersome to use. The existing non-destructive, non-invasive and label-free super-resolution imaging (SRI) methods are also challenging, complex and elusive to apply. To address these issues, here we propose and experimentally demonstrate a new concept of label-free sub-diffraction optical imaging. The transmission avalanche backlight (TAB) microscopy exploits huge optical non-linearities of photon avalanching materials, which are acting as a virtual near-field nano aperture - a diffraction limited backlight of the actual sample. Such approach enables to augment imaging contrast of highly transparent samples and thin layers, by translating small attenuation and scattering loses occurring on these translucent samples into amplified modulation of luminescence intensity of the avalanche backlighted substrate (ABS). At no additional cost, sub-diffraction imaging is achieved with simple, single beam laser scanning microscopy setup, leading to ca. 70 nm optical resolution. This far-field, label-free, raster scanning imaging technique, with augmented contrast and optical imaging resolution below diffraction limit, may become pivotal for studies in biology, physics, materials science, nanophotonics and nanoengineering |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2507_14667 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Label free sub-diffraction imaging using non-linear photon avalanche backlight Karmegam, Suresh Szalkowski, Marcin Misiak, Malgorzata Prorok, Katarzyna Szymański, Damian Bednarkiewicz, Artur Optics Materials Science Optical imaging below the limit of light diffraction offers an unprecedented opportunity to study outlook, organization, interactions or in-situ functioning of sub-micrometer, highly transparent objects such as subcellular structures in vitro, thin layers or nano-engineered devices. However, most of current methodologies require to use specially designed luminescent labels, which not only may affect the properties of the sample itself, but often are (photo)toxic, susceptible to photobleaching, offer limited color combinations or specificity of labeling. Moreover, the dedicated fluorescence based super-resolution optical techniques are often technically complex and cumbersome to use. The existing non-destructive, non-invasive and label-free super-resolution imaging (SRI) methods are also challenging, complex and elusive to apply. To address these issues, here we propose and experimentally demonstrate a new concept of label-free sub-diffraction optical imaging. The transmission avalanche backlight (TAB) microscopy exploits huge optical non-linearities of photon avalanching materials, which are acting as a virtual near-field nano aperture - a diffraction limited backlight of the actual sample. Such approach enables to augment imaging contrast of highly transparent samples and thin layers, by translating small attenuation and scattering loses occurring on these translucent samples into amplified modulation of luminescence intensity of the avalanche backlighted substrate (ABS). At no additional cost, sub-diffraction imaging is achieved with simple, single beam laser scanning microscopy setup, leading to ca. 70 nm optical resolution. This far-field, label-free, raster scanning imaging technique, with augmented contrast and optical imaging resolution below diffraction limit, may become pivotal for studies in biology, physics, materials science, nanophotonics and nanoengineering |
| title | Label free sub-diffraction imaging using non-linear photon avalanche backlight |
| topic | Optics Materials Science |
| url | https://arxiv.org/abs/2507.14667 |