Fast 4D-STEM-based phase mapping for amorphous and mixed materials

Fuente: arXiv

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Bibliographic Details
Main Authors:	Werbrouck, Andreas, Paranamana, Nikhila C., He, Xiaoqing, Young, Matthias J.
Format:	Preprint
Published:	2025
Subjects:	Materials Science Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2507.17068