Multi-Scale PCB Defect Detection with YOLOv8 Network Improved via Pruning and Lightweight Network

Fuente: arXiv

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Bibliographic Details
Main Authors:	Pingzhen, Li, Sheng, Xu, Jing, Chen, Chengyue, Su
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2507.17176