YATE: The Role of Test Repair in LLM-Based Unit Test Generation

Fuente: arXiv

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Bibliographic Details
Main Authors:	Konstantinou, Michael, Degiovanni, Renzo, Zhang, Jie M., Harman, Mark, Papadakis, Mike
Format:	Preprint
Published:	2025
Subjects:	Software Engineering
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2507.18316