YATE: The Role of Test Repair in LLM-Based Unit Test Generation
Fuente:
arXiv
Guardado en:
| Autores principales: | Konstantinou, Michael, Degiovanni, Renzo, Zhang, Jie M., Harman, Mark, Papadakis, Mike |
|---|---|
| Formato: | Preprint |
| Publicado: |
2025
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| Materias: | |
| Acceso en línea: | |
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