APA (7th ed.) Citation

Miyaguchi, K., Joko, M., Sheraw, R., & Idé, T. (2025). Wafer Defect Root Cause Analysis with Partial Trajectory Regression.

Chicago Style (17th ed.) Citation

Miyaguchi, Kohei, Masao Joko, Rebekah Sheraw, and Tsuyoshi Idé. Wafer Defect Root Cause Analysis with Partial Trajectory Regression. 2025.

MLA (9th ed.) Citation

Miyaguchi, Kohei, et al. Wafer Defect Root Cause Analysis with Partial Trajectory Regression. 2025.