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Main Authors: Li, Xinyan, Ashen, Kenna, Shi, Chuqiao, Mao, Nannan, Kolachina, Saagar, Yang, Kaiwen, Zhang, Tianyi, Husain, Sajid, Ramesh, Ramamoorthy, Kong, Jing, Qian, Xiaofeng, Han, Yimo
Format: Preprint
Published: 2025
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Online Access:https://arxiv.org/abs/2507.20543
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author Li, Xinyan
Ashen, Kenna
Shi, Chuqiao
Mao, Nannan
Kolachina, Saagar
Yang, Kaiwen
Zhang, Tianyi
Husain, Sajid
Ramesh, Ramamoorthy
Kong, Jing
Qian, Xiaofeng
Han, Yimo
author_facet Li, Xinyan
Ashen, Kenna
Shi, Chuqiao
Mao, Nannan
Kolachina, Saagar
Yang, Kaiwen
Zhang, Tianyi
Husain, Sajid
Ramesh, Ramamoorthy
Kong, Jing
Qian, Xiaofeng
Han, Yimo
contents Two-dimensional van der Waals (vdW) materials hold the potential for ultra-scaled ferroelectric (FE) devices due to their silicon compatibility and robust polarization down to atomic scale. However, the inherently weak vdW interactions enable facile sliding between layers, introducing complexities beyond those encountered in conventional ferroelectric materials and presenting significant challenges in uncovering intricate switching pathways. Here, we combine atomic-resolution imaging under in-situ electrical biasing conditions with first-principles calculations to unravel the atomic-scale switching mechanisms in SnSe, a vdW group-IV monochalcogenide. Our results uncover the coexistence of a consecutive 90 degrees switching pathway and a direct 180 degrees switching pathway from antiferroelectric (AFE) to FE order in this vdW system. Atomic-scale investigations and strain analysis reveal that the switching processes simultaneously induce interlayer sliding and compressive strain, while the lattice remains coherent despite the presence of multidomain structures. These findings elucidate vdW ferroelectric switching dynamics at atomic scale and lay the foundation for the rational design of 2D ferroelectric nanodevices.
format Preprint
id arxiv_https___arxiv_org_abs_2507_20543
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Revealing Atomic-Scale Switching Pathways in van der Waals Ferroelectrics
Li, Xinyan
Ashen, Kenna
Shi, Chuqiao
Mao, Nannan
Kolachina, Saagar
Yang, Kaiwen
Zhang, Tianyi
Husain, Sajid
Ramesh, Ramamoorthy
Kong, Jing
Qian, Xiaofeng
Han, Yimo
Materials Science
Two-dimensional van der Waals (vdW) materials hold the potential for ultra-scaled ferroelectric (FE) devices due to their silicon compatibility and robust polarization down to atomic scale. However, the inherently weak vdW interactions enable facile sliding between layers, introducing complexities beyond those encountered in conventional ferroelectric materials and presenting significant challenges in uncovering intricate switching pathways. Here, we combine atomic-resolution imaging under in-situ electrical biasing conditions with first-principles calculations to unravel the atomic-scale switching mechanisms in SnSe, a vdW group-IV monochalcogenide. Our results uncover the coexistence of a consecutive 90 degrees switching pathway and a direct 180 degrees switching pathway from antiferroelectric (AFE) to FE order in this vdW system. Atomic-scale investigations and strain analysis reveal that the switching processes simultaneously induce interlayer sliding and compressive strain, while the lattice remains coherent despite the presence of multidomain structures. These findings elucidate vdW ferroelectric switching dynamics at atomic scale and lay the foundation for the rational design of 2D ferroelectric nanodevices.
title Revealing Atomic-Scale Switching Pathways in van der Waals Ferroelectrics
topic Materials Science
url https://arxiv.org/abs/2507.20543