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Large-scale characterization of Single-Hole Transistors in 22-nm FDSOI CMOS Technology

Fuente: arXiv

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Bibliographic Details
Main Authors:	Swift, Thomas H., Gomez-Saiz, Alberto, Ciriano-Tejel, Virginia N., Wise, David F., Noah, Grayson M., Morton, John J. L., Gonzalez-Zalba, M. Fernando, Johnson, Mark A. I.
Format:	Preprint
Published:	2025
Subjects:	Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
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