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Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures

Fuente: arXiv

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Bibliographic Details
Main Authors:	Powell, Megan, Parry, Euan, McGeough, Conor, Zotov, Alexander, Rossi, Alessandro
Format:	Preprint
Published:	2025
Subjects:	Applied Physics Materials Science
Online Access:	Acceder al recurso
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