Silent Data Corruption by 10x Test Escapes Threatens Reliable Computing

Fuente: arXiv

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Bibliographic Details
Main Authors:	Mitra, Subhasish, Banerjee, Subho, Dixon, Martin, Govindaraju, Rama, Hochschild, Peter, Liu, Eric X., Parthasarathy, Bharath, Ranganathan, Parthasarathy
Format:	Preprint
Published:	2025
Subjects:	Hardware Architecture B.7; C.0; C.5
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2508.01786