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Bibliographic Details
Main Author: Leeb, William
Format: Preprint
Published: 2025
Subjects:
Online Access:https://arxiv.org/abs/2508.02678
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author Leeb, William
author_facet Leeb, William
contents This paper studies the family of sliced Cramér metrics, quantifying their stability under distortions of the input functions. Our results bound the growth of the sliced Cramér distance between a function and its geometric deformation by the product of the deformation's displacement size and the function's mean mixed norm. These results extend to sliced Cramér distances between tomographic projections. In addition, we remark on the effect of convolution on the sliced Cramér metrics. We also analyze efficient Fourier-based discretizations in 1D and 2D, and prove that they are robust to heteroscedastic noise. The results are illustrated by numerical experiments.
format Preprint
id arxiv_https___arxiv_org_abs_2508_02678
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle On sliced Cramér metrics
Leeb, William
Numerical Analysis
This paper studies the family of sliced Cramér metrics, quantifying their stability under distortions of the input functions. Our results bound the growth of the sliced Cramér distance between a function and its geometric deformation by the product of the deformation's displacement size and the function's mean mixed norm. These results extend to sliced Cramér distances between tomographic projections. In addition, we remark on the effect of convolution on the sliced Cramér metrics. We also analyze efficient Fourier-based discretizations in 1D and 2D, and prove that they are robust to heteroscedastic noise. The results are illustrated by numerical experiments.
title On sliced Cramér metrics
topic Numerical Analysis
url https://arxiv.org/abs/2508.02678