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Embedding-Enhanced Probabilistic Modeling of Ferroelectric Field Effect Transistors (FeFETs)

Fuente: arXiv

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Bibliographic Details
Main Authors:	Afee, Tasnia Nobi, Hutchins, Jack, Islam, Md Mazharul, Kampfe, Thomas, Aziz, Ahmedullah
Format:	Preprint
Published:	2025
Subjects:	Machine Learning Emerging Technologies
Online Access:	Acceder al recurso
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