Separate-scan atomic force microscope for fast infrared scattering-type scanning near-field optical microscope

Fuente: arXiv

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Bibliographic Details
Main Authors:	Sakiyama, Yusuke, Pfitzner, Emanuel, Andany, Santiago H., Fantner, Georg E., Heberle, Joachim
Format:	Preprint
Published:	2025
Subjects:	Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2508.02877