Copertina

Separate-scan atomic force microscope for fast infrared scattering-type scanning near-field optical microscope

Fuente: arXiv

Salvato in:

Dettagli Bibliografici
Autori principali:	Sakiyama, Yusuke, Pfitzner, Emanuel, Andany, Santiago H., Fantner, Georg E., Heberle, Joachim
Natura:	Preprint
Pubblicazione:	2025
Soggetti:	Instrumentation and Detectors
Accesso online:	Acceder al recurso
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

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