Saved in:
| Main Authors: | , , , , , , , , , , , , , |
|---|---|
| Format: | Preprint |
| Published: |
2025
|
| Subjects: | |
| Online Access: | https://arxiv.org/abs/2508.04142 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1866909724142731264 |
|---|---|
| author | Carré, Etienne Fossard, Frédéric Mérot, Jean-Sébastien Boivin, Denis Horezan, Nicolas Zatko, Victor Godel, Florian Dlubak, Bruno Martin, Marie-Blandine Seneor, Pierre Gaufres, Etienne Barjon, Julien Loiseau, Annick Stenger, Ingrid |
| author_facet | Carré, Etienne Fossard, Frédéric Mérot, Jean-Sébastien Boivin, Denis Horezan, Nicolas Zatko, Victor Godel, Florian Dlubak, Bruno Martin, Marie-Blandine Seneor, Pierre Gaufres, Etienne Barjon, Julien Loiseau, Annick Stenger, Ingrid |
| contents | The crystallographic orientation of anisotropic 2D materials plays a crucial role in their physical properties and device performance. However, standard orientation techniques such as transmission electron microscopy (TEM) or X-ray diffraction (XRD) can be complex and less accessible for routine characterization. In this study, we investigate the orientation of black phosphorus (BP) from bulk crystals to thin layers using angle-resolved polarized Raman spectroscopy (ARPRS) with a single-wavelength (514 nm) Raman setup. By incorporating thickness-dependent interference effects and anisotropic optical indices, this approach provides a reliable framework for orientation determination across different BP thicknesses. The method is validated through direct orientation measurements using TEM and Electron Backscattering Diffraction (EBSD), confirming its applicability to both thick and ultrathin samples. Given its simplicity and compatibility with widely available Raman setups, this approach offers a practical solution for characterizing BP orientation without requiring advanced structural characterization techniques. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2508_04142 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Straightforward Method to Orient Black Phosphorus from Bulk to Thin Layers using a Standard Green Laser Carré, Etienne Fossard, Frédéric Mérot, Jean-Sébastien Boivin, Denis Horezan, Nicolas Zatko, Victor Godel, Florian Dlubak, Bruno Martin, Marie-Blandine Seneor, Pierre Gaufres, Etienne Barjon, Julien Loiseau, Annick Stenger, Ingrid Mesoscale and Nanoscale Physics The crystallographic orientation of anisotropic 2D materials plays a crucial role in their physical properties and device performance. However, standard orientation techniques such as transmission electron microscopy (TEM) or X-ray diffraction (XRD) can be complex and less accessible for routine characterization. In this study, we investigate the orientation of black phosphorus (BP) from bulk crystals to thin layers using angle-resolved polarized Raman spectroscopy (ARPRS) with a single-wavelength (514 nm) Raman setup. By incorporating thickness-dependent interference effects and anisotropic optical indices, this approach provides a reliable framework for orientation determination across different BP thicknesses. The method is validated through direct orientation measurements using TEM and Electron Backscattering Diffraction (EBSD), confirming its applicability to both thick and ultrathin samples. Given its simplicity and compatibility with widely available Raman setups, this approach offers a practical solution for characterizing BP orientation without requiring advanced structural characterization techniques. |
| title | Straightforward Method to Orient Black Phosphorus from Bulk to Thin Layers using a Standard Green Laser |
| topic | Mesoscale and Nanoscale Physics |
| url | https://arxiv.org/abs/2508.04142 |