Template masks for 4D-STEM
Fuente:
arXiv
Saved in:
| Main Authors: | , , , , , |
|---|---|
| Format: | Preprint |
| Published: |
2025
|
| Subjects: | |
| Online Access: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1866912527777005568 |
|---|---|
| author | Xie, Yining Moynihan, Eoin Alexe, Marin Piper, Louis Sanchez, Ana Beanland, Richard |
| author_facet | Xie, Yining Moynihan, Eoin Alexe, Marin Piper, Louis Sanchez, Ana Beanland, Richard |
| contents | We present a new analysis method for atomic resolution four-dimensional scanning transmission electron microscopy (4D-STEM, in which a diffraction pattern is collected at each point of a raster scan of a focused electron beam across the specimen). In 4D-STEM, each measured intensity has a dual character, forming a pixel in a diffraction pattern and, equally, forming a pixel in a STEM image. Applying a mask to the data to obtain a "virtual" bright field or dark field image is widely used and understood. However, there is a complementary procedure, in which an image (template) is applied to the data to obtain a mask. This mask shows the correlation between the data and the template and, when applied to atomic resolution 4D-STEM data produces an image optimised for the template. This allows, for example, imaging of specific atom columns and is a significant improvement over user-defined masks such as virtual annular bright field imaging. We demonstrate the capability of the approach, separately imaging Li and O atom columns in LiFePO4 and O, Pb and Ti across a domain wall in PbTiO3.These template masks provide a computationally straightforward and general method to probe 4D-STEM data. They are particularly effective for specimens of moderate thickness where multiple scattering produces strong and specific correlations in diffraction patterns. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2508_06371 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Template masks for 4D-STEM Xie, Yining Moynihan, Eoin Alexe, Marin Piper, Louis Sanchez, Ana Beanland, Richard Instrumentation and Detectors Materials Science We present a new analysis method for atomic resolution four-dimensional scanning transmission electron microscopy (4D-STEM, in which a diffraction pattern is collected at each point of a raster scan of a focused electron beam across the specimen). In 4D-STEM, each measured intensity has a dual character, forming a pixel in a diffraction pattern and, equally, forming a pixel in a STEM image. Applying a mask to the data to obtain a "virtual" bright field or dark field image is widely used and understood. However, there is a complementary procedure, in which an image (template) is applied to the data to obtain a mask. This mask shows the correlation between the data and the template and, when applied to atomic resolution 4D-STEM data produces an image optimised for the template. This allows, for example, imaging of specific atom columns and is a significant improvement over user-defined masks such as virtual annular bright field imaging. We demonstrate the capability of the approach, separately imaging Li and O atom columns in LiFePO4 and O, Pb and Ti across a domain wall in PbTiO3.These template masks provide a computationally straightforward and general method to probe 4D-STEM data. They are particularly effective for specimens of moderate thickness where multiple scattering produces strong and specific correlations in diffraction patterns. |
| title | Template masks for 4D-STEM |
| topic | Instrumentation and Detectors Materials Science |
| url | https://arxiv.org/abs/2508.06371 |