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Error-Resilient Fast Entangling Gates for Scalable Ion-Trap Quantum Processors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Savill-Brown, Isabelle, Mehdi, Zain, Ratcliffe, Alexander K., Vaidya, Varun D., Liu, Haonan, Haine, Simon A., Viteri, C. Ricardo, Hope, Joseph J.
Format:	Preprint
Published:	2025
Subjects:	Quantum Physics
Online Access:	Acceder al recurso
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