Fujiwara, H., Itoya, Y., Kobayashi, M., Bareille, C., & Taniuchi, T. (2025). Breakdown and polarization contrasts in ferroelectric devices observed by operando laser-based photoemission electron microscopy with the AC/DC electrical characterization system.
Cita Chicago Style (17a ed.)Fujiwara, Hirokazu, Yuki Itoya, Masaharu Kobayashi, Cédric Bareille, y Toshiyuki Taniuchi. Breakdown and Polarization Contrasts in Ferroelectric Devices Observed by Operando Laser-based Photoemission Electron Microscopy with the AC/DC Electrical Characterization System. 2025.
Cita MLA (9a ed.)Fujiwara, Hirokazu, et al. Breakdown and Polarization Contrasts in Ferroelectric Devices Observed by Operando Laser-based Photoemission Electron Microscopy with the AC/DC Electrical Characterization System. 2025.