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Breakdown and polarization contrasts in ferroelectric devices observed by operando laser-based photoemission electron microscopy with the AC/DC electrical characterization system

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Fujiwara, Hirokazu, Itoya, Yuki, Kobayashi, Masaharu, Bareille, Cédric, Taniuchi, Toshiyuki
Formato:	Preprint
Publicado:	2025
Materias:	Materials Science Applied Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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