SynSpill: Improved Industrial Spill Detection With Synthetic Data

Fuente: arXiv

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Bibliographic Details
Main Authors:	Baranwal, Aaditya, Mueez, Abdul, Voelker, Jason, Bhatia, Guneet, Vyas, Shruti
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Emerging Technologies
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2508.10171