Electronic localization on the structural inhomogeneities formed due to Bi and Te deficiency in the MBE grown films of AFM topological insulator MnBi2Te4: Evidence from spectroscopic ellipsometry and infrared studies

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kovaleva, N. N., Chvostova, D., Fursova, T. N., Muratov, A. V., Bozhko, S. I., Aleshchenko, Yu. A., Dejneka, A., Ishchenko, D. V., Tereshchenko, O. E., Kugel, K. I.
Format:	Preprint
Published:	2025
Subjects:	Strongly Correlated Electrons Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2508.10440