Bayer, F., Russo, M., & Rathgeb, C. (2025). Training-free Dimensionality Reduction via Feature Truncation: Enhancing Efficiency in Privacy-preserving Multi-Biometric Systems.
Style de citation Chicago (17e éd.)Bayer, Florian, Maximilian Russo, et Christian Rathgeb. Training-free Dimensionality Reduction via Feature Truncation: Enhancing Efficiency in Privacy-preserving Multi-Biometric Systems. 2025.
Style de citation MLA (9e éd.)Bayer, Florian, et al. Training-free Dimensionality Reduction via Feature Truncation: Enhancing Efficiency in Privacy-preserving Multi-Biometric Systems. 2025.
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