Development and testing of integrated readout electronics for next generation SiSeRO (Single electron Sensitive Read Out) devices

Fuente: arXiv
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Bibliographic Details
Main Authors: Chattopadhyay, Tanmoy, Stueber, Haley R., Pan, Abigail Y., Herrmann, Sven, Orel, Peter, Donlon, Kevan, Allen, Steven W., Bautz, Marshall W., Cooper, Michael, Grant, Catherine E., LaMarr, Beverly, Leitz, Christopher, Malonis, Andrew, Miller, Eric D., Morris, R. Glenn, Prigozhin, Gregory, Prigozhin, Ilya, Poliszczuk, Artem, Warner, Keith, Wilkins, Daniel R.
Format: Preprint
Published: 2025
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