Development and testing of integrated readout electronics for next generation SiSeRO (Single electron Sensitive Read Out) devices
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| Main Authors: | Chattopadhyay, Tanmoy, Stueber, Haley R., Pan, Abigail Y., Herrmann, Sven, Orel, Peter, Donlon, Kevan, Allen, Steven W., Bautz, Marshall W., Cooper, Michael, Grant, Catherine E., LaMarr, Beverly, Leitz, Christopher, Malonis, Andrew, Miller, Eric D., Morris, R. Glenn, Prigozhin, Gregory, Prigozhin, Ilya, Poliszczuk, Artem, Warner, Keith, Wilkins, Daniel R. |
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| Format: | Preprint |
| Published: |
2025
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