Backpropagation-Free Test-Time Adaptation via Probabilistic Gaussian Alignment

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhang, Youjia, Kim, Youngeun, Choi, Young-Geun, Kim, Hongyeob, Liu, Huiling, Hong, Sungeun
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2508.15568