Wavelet-Enhanced PaDiM for Industrial Anomaly Detection
Fuente:
arXiv
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Preprint |
| Published: |
2025
|
| Subjects: | |
| Online Access: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1866911116467109888 |
|---|---|
| author | Gardner, Cory Min, Byungseok Ahn, Tae-Hyuk |
| author_facet | Gardner, Cory Min, Byungseok Ahn, Tae-Hyuk |
| contents | Anomaly detection and localization in industrial images are essential for automated quality inspection. PaDiM, a prominent method, models the distribution of normal image features extracted by pre-trained Convolutional Neural Networks (CNNs) but reduces dimensionality through random channel selection, potentially discarding structured information. We propose Wavelet-Enhanced PaDiM (WE-PaDiM), which integrates Discrete Wavelet Transform (DWT) analysis with multi-layer CNN features in a structured manner. WE-PaDiM applies 2D DWT to feature maps from multiple backbone layers, selects specific frequency subbands (e.g., LL, LH, HL), spatially aligns them, and concatenates them channel-wise before modeling with PaDiM's multivariate Gaussian framework. This DWT-before-concatenation strategy provides a principled method for feature selection based on frequency content relevant to anomalies, leveraging multi-scale wavelet information as an alternative to random selection. We evaluate WE-PaDiM on the challenging MVTec AD dataset with multiple backbones (ResNet-18 and EfficientNet B0-B6). The method achieves strong performance in anomaly detection and localization, yielding average results of 99.32% Image-AUC and 92.10% Pixel-AUC across 15 categories with per-class optimized configurations. Our analysis shows that wavelet choices affect performance trade-offs: simpler wavelets (e.g., Haar) with detail subbands (HL or LH/HL/HH) often enhance localization, while approximation bands (LL) improve image-level detection. WE-PaDiM thus offers a competitive and interpretable alternative to random feature selection in PaDiM, achieving robust results suitable for industrial inspection with comparable efficiency. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2508_16034 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Wavelet-Enhanced PaDiM for Industrial Anomaly Detection Gardner, Cory Min, Byungseok Ahn, Tae-Hyuk Computer Vision and Pattern Recognition Anomaly detection and localization in industrial images are essential for automated quality inspection. PaDiM, a prominent method, models the distribution of normal image features extracted by pre-trained Convolutional Neural Networks (CNNs) but reduces dimensionality through random channel selection, potentially discarding structured information. We propose Wavelet-Enhanced PaDiM (WE-PaDiM), which integrates Discrete Wavelet Transform (DWT) analysis with multi-layer CNN features in a structured manner. WE-PaDiM applies 2D DWT to feature maps from multiple backbone layers, selects specific frequency subbands (e.g., LL, LH, HL), spatially aligns them, and concatenates them channel-wise before modeling with PaDiM's multivariate Gaussian framework. This DWT-before-concatenation strategy provides a principled method for feature selection based on frequency content relevant to anomalies, leveraging multi-scale wavelet information as an alternative to random selection. We evaluate WE-PaDiM on the challenging MVTec AD dataset with multiple backbones (ResNet-18 and EfficientNet B0-B6). The method achieves strong performance in anomaly detection and localization, yielding average results of 99.32% Image-AUC and 92.10% Pixel-AUC across 15 categories with per-class optimized configurations. Our analysis shows that wavelet choices affect performance trade-offs: simpler wavelets (e.g., Haar) with detail subbands (HL or LH/HL/HH) often enhance localization, while approximation bands (LL) improve image-level detection. WE-PaDiM thus offers a competitive and interpretable alternative to random feature selection in PaDiM, achieving robust results suitable for industrial inspection with comparable efficiency. |
| title | Wavelet-Enhanced PaDiM for Industrial Anomaly Detection |
| topic | Computer Vision and Pattern Recognition |
| url | https://arxiv.org/abs/2508.16034 |