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On the nature and charge state of the X-Defect, a radiation-induced Silicon defect with field-enhanced charge carrier emission

Fuente: arXiv

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Bibliographic Details
Main Authors:	Sorgenfrei, Niels, Gurimskaya, Yana, Himmerlich, Anja, Moll, Michael, Parzefall, Ulrich, Pintilie, Ioana, Schwandt, Joern
Format:	Preprint
Published:	2025
Subjects:	Materials Science High Energy Physics - Experiment Instrumentation and Detectors
Online Access:	Acceder al recurso
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