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Polarization- and time-resolved nonlinear multi-photon spectroscopy for confocal microscopy of semiconductor nanostructures

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Siverin, Nikita V., Farenbruch, Andreas, Yakovlev, Dmitri R., Gillard, Daniel J., Hu, Xuerong, Tartakovskii, Alexander I., Bayer, Manfred
Formato:	Preprint
Publicado:	2025
Materias:	Materials Science
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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