No Label Left Behind: A Unified Surface Defect Detection Model for all Supervision Regimes

Fuente: arXiv

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Bibliographic Details
Main Authors:	Rolih, Blaž, Fučka, Matic, Skočaj, Danijel
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2508.19060